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From version < 26.1 >
edited by Jette Petzold
on 2022/06/20 08:19
To version < 25.1 >
edited by Alexander Schulz-Rosengarten
on 2022/06/20 07:38
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92 92  (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)H. Reza, M. Pimple, V. Krishna and J. Hildle, [[A Safety Analysis Method Using Fault Tree Analysis and Petri Nets>>url:https://ieeexplore.ieee.org/document/5070769||shape="rect"]]. (% style="color: rgb(34,34,34);" %)//2009 Sixth International Conference on Information Technology: New Generations//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %), 2009, pp. 1089-1094, doi: 10.1109/ITNG.2009.183.
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94 94  (% style="margin-left: 30.0px;" %)
95 -(% style="color: rgb(51,51,51);" %)J. Axelsson and A. Kobetski, [[Towards a risk analysis method for systems-of-systems based on systems thinking>>url:https://ieeexplore.ieee.org/document/8369501||shape="rect"]]. //2018 Annual IEEE International Systems Conference (SysCon)//, 2018, pp. 1-8, doi: 10.1109/SYSCON.2018.8369501.
95 +(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)N. Jiang, G. Li and B. Liu, [[Model-based safety analyses of embedded system using stateflow>>url:https://ieeexplore.ieee.org/document/8050084||shape="rect"]]. //2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)//, 2016, pp. 1-6, doi: 10.1109/ICRMS.2016.8050084.
96 96  
97 97  (% style="margin-left: 30.0px;" %)
98 -(% style="color: rgb(51,51,51);" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
98 +(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)G. Chen, Z. Yang, J. Zhao and Z. Fei, [[Dynamic Bayesian networks method of safety analysis based on reliability block diagram>>url:https://ieeexplore.ieee.org/document/7107363||shape="rect"]]. //2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)//, 2014, pp. 1047-1051, doi: 10.1109/ICRMS.2014.7107363.
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100 100  (% style="margin-left: 30.0px;" %)
101 101  (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)D. L. Gurgel, C. M. Hirata and J. De M. Bezerra, [[A rule-based approach for safety analysis using STAMP/STPA>>url:https://ieeexplore.ieee.org/document/7311464||shape="rect"]]. //2015 IEEE/AIAA 34th Digital Avionics Systems Conference (DASC)//, 2015, pp. 7B2-1-7B2-8, doi: 10.1109/DASC.2015.7311464.
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147 147  (% style="margin-left: 30.0px;" %)
148 148  (% style="color: rgb(51,51,51);" %)A. Gannous, A. Andrews and B. Gallina, [[Toward a Systematic and Safety Evidence Productive Verification Approach for Safety-Critical Systems>>url:https://ieeexplore.ieee.org/document/8539215||shape="rect"]]. (%%)//2018 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)//(% style="color: rgb(51,51,51);" %), 2018, pp. 329-336, doi: 10.1109/ISSREW.2018.00026.
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150 +(% style="margin-left: 30.0px;" %)
151 +(% style="color: rgb(51,51,51);" %)J. Axelsson and A. Kobetski, [[Towards a risk analysis method for systems-of-systems based on systems thinking>>url:https://ieeexplore.ieee.org/document/8369501||shape="rect"]]. //2018 Annual IEEE International Systems Conference (SysCon)//, 2018, pp. 1-8, doi: 10.1109/SYSCON.2018.8369501.
152 +
153 +(% style="margin-left: 30.0px;" %)
154 +(% style="color: rgb(51,51,51);" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
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151 151  = Schedule =
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