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95	95	(% style="color: rgb(34,34,34);" %)Sven Stefan Krauss, Martin Rejzek, and Christian Hilbes. [[Tool Qualification Considerations for Tools Supporting STPA>>url:https://www.sciencedirect.com/science/article/pii/S1877705815038606||shape="rect"]]. (% style="text-align: left;" %)//Procedia Engineering//(% style="color: rgb(34,34,34);" %) 128 (2015): 15-24.
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97	97	(% style="margin-left: 30.0px;" %)
98		-(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)H. Reza, M. Pimple, V. Krishna and J. Hildle, [[A Safety Analysis Method Using Fault Tree Analysis and Petri Nets>>url:https://ieeexplore.ieee.org/document/5070769||shape="rect"]]. (% style="color: rgb(34, 34, 34)" %)//2009 Sixth International Conference on Information Technology: New Generations//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %), 2009, pp. 1089-1094, doi: 10.1109/ITNG.2009.183.
	98	+(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)H. Reza, M. Pimple, V. Krishna and J. Hildle, [[A Safety Analysis Method Using Fault Tree Analysis and Petri Nets>>url:https://ieeexplore.ieee.org/document/5070769||shape="rect"]]. (% style="color: rgb(34,34,34);" %)//2009 Sixth International Conference on Information Technology: New Generations//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %), 2009, pp. 1089-1094, doi: 10.1109/ITNG.2009.183.
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100	100	(% style="margin-left: 30.0px;" %)
101	101	(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)N. Jiang, G. Li and B. Liu, [[Model-based safety analyses of embedded system using stateflow>>url:https://ieeexplore.ieee.org/document/8050084||shape="rect"]]. //2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)//, 2016, pp. 1-6, doi: 10.1109/ICRMS.2016.8050084.
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103	103	(% style="margin-left: 30.0px;" %)
104		-(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)G. Chen, Z. Yang, J. Zhao and Z. Fei, [[Dynamic Bayesian networks method of safety analysis based on reliability block diagram ~| IEEE Conference Publication ~| IEEE Xplore>>url:https://ieeexplore.ieee.org/document/7107363||shape="rect"]]. //2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)//, 2014, pp. 1047-1051, doi: 10.1109/ICRMS.2014.7107363.
	104	+(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)G. Chen, Z. Yang, J. Zhao and Z. Fei, [[Dynamic Bayesian networks method of safety analysis based on reliability block diagram>>url:https://ieeexplore.ieee.org/document/7107363||shape="rect"]]. //2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)//, 2014, pp. 1047-1051, doi: 10.1109/ICRMS.2014.7107363.
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106	106	(% style="margin-left: 30.0px;" %)
107	107	(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)D. L. Gurgel, C. M. Hirata and J. De M. Bezerra, [[A rule-based approach for safety analysis using STAMP/STPA>>url:https://ieeexplore.ieee.org/document/7311464||shape="rect"]]. //2015 IEEE/AIAA 34th Digital Avionics Systems Conference (DASC)//, 2015, pp. 7B2-1-7B2-8, doi: 10.1109/DASC.2015.7311464.
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149	149	**Safety Analysis**
150	150
151	151	(% style="margin-left: 30.0px;" %)
152		-(% style="color: rgb(51,51,51);" %)A. Gannous, A. Andrews and B. Gallina, [[Toward a Systematic and Safety Evidence Productive Verification Approach for Safety-Critical Systems>>url:https://ieeexplore.ieee.org/document/8539215||shape="rect"]]. (% style="" %)//2018 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)//(% style="color: rgb(51,51,51);" %), 2018, pp. 329-336, doi: 10.1109/ISSREW.2018.00026.
	152	+(% style="color: rgb(51,51,51);" %)A. Gannous, A. Andrews and B. Gallina, [[Toward a Systematic and Safety Evidence Productive Verification Approach for Safety-Critical Systems>>url:https://ieeexplore.ieee.org/document/8539215||shape="rect"]]. (%%)//2018 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)//(% style="color: rgb(51,51,51);" %), 2018, pp. 329-336, doi: 10.1109/ISSREW.2018.00026.
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154	154	(% style="margin-left: 30.0px;" %)
155		-(% style="color: rgb(51,51,51);" %)J. Axelsson and A. Kobetski, [[Towards a risk analysis method for systems-of-systems based on systems thinking>>url:https://ieeexplore.ieee.org/document/8369501||shape="rect"]]. (% style="color: rgb(51, 51, 51)" %)//2018 Annual IEEE International Systems Conference (SysCon)//(% style="color: rgb(51,51,51);" %), 2018, pp. 1-8, doi: 10.1109/SYSCON.2018.8369501.
	155	+(% style="color: rgb(51,51,51);" %)J. Axelsson and A. Kobetski, [[Towards a risk analysis method for systems-of-systems based on systems thinking>>url:https://ieeexplore.ieee.org/document/8369501||shape="rect"]]. //2018 Annual IEEE International Systems Conference (SysCon)//, 2018, pp. 1-8, doi: 10.1109/SYSCON.2018.8369501.
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157	157	(% style="margin-left: 30.0px;" %)
158		-(% style="color: rgb(51,51,51);" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. (% style="color: rgb(51, 51, 51)" %)//2020 IEEE International Systems Conference (SysCon)//(% style="color: rgb(51,51,51);" %), 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
	158	+(% style="color: rgb(51,51,51);" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
159	159	{{/expand}}
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161	161	= Schedule =

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