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From version < 11.1 >
edited by Jette Petzold
on 2023/02/09 14:51
To version < 12.1 >
edited by Jette Petzold
on 2023/02/09 15:40
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82 82  (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386||shape="rect"]]. In (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51); text-align: left" %)//2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %), pp. 26-33. IEEE, 2011.
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84 84  (% style="margin-left: 30.0px;" %)
85 -(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)L. A. Cortes, P. Eles, and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1||shape="rect"]]. (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51); text-align: left" %)//Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %). Vol. 1. IEEE, 2000.
85 +(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)L. A. Cortes, P. Eles and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1||shape="rect"]]. (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51); text-align: left" %)//Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %). Vol. 1. IEEE, 2000.
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87 87  
88 +(% style="margin-left: 30.0px;" %)
89 +(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)L. Apvrille and L. W. Li. [[Harmonizing safety, security and performance requirements in embedded systems.>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=8715124||shape="rect"]]. In (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51); text-align: left" %)//2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %), pp. 1631-1636. IEEE, 2019.
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88 88  (% style="color: rgb(23,43,77);" %)
89 89  === Master Recommendations (not yet complete list, more to follow) ===
90 90  
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Id
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1 -142606471
1 +142606472
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1 -https://rtsys.informatik.uni-kiel.de/confluence//wiki/spaces/SEM/pages/142606471/SS23 (Embedded Real-Time Systems)
1 +https://rtsys.informatik.uni-kiel.de/confluence//wiki/spaces/SEM/pages/142606472/SS23 (Embedded Real-Time Systems)