Changes for page 2023 Embedded Real-Time Systems
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... ... @@ -79,9 +79,15 @@ 79 79 (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)D. L. Gurgel, C. M. Hirata and J. De M. Bezerra, [[A rule-based approach for safety analysis using STAMP/STPA>>url:https://ieeexplore.ieee.org/document/7311464||shape="rect"]]. //2015 IEEE/AIAA 34th Digital Avionics Systems Conference (DASC)//, 2015, pp. 7B2-1-7B2-8, doi: 10.1109/DASC.2015.7311464. 80 80 81 81 (% style="margin-left: 30.0px;" %) 82 -(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %) L.A. Cortes,P.Eles, andZ.Peng,[[Formalcoverification of embedded systemsusingmodelchecking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1||shape="rect"]]. (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51); text-align: left" %)//Proceedingsofthe26th Euromicro Conference.EUROMICRO 2000. Informatics:InventingtheFuture//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %).Vol.1. IEEE, 2000.82 +(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386||shape="rect"]]. In (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51); text-align: left" %)//2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %), pp. 26-33. IEEE, 2011. 83 83 84 +(% style="margin-left: 30.0px;" %) 85 +(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)L. A. Cortes, P. Eles and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1||shape="rect"]]. (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51); text-align: left" %)//Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %). Vol. 1. IEEE, 2000. 84 84 87 + 88 +(% style="margin-left: 30.0px;" %) 89 +(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)L. Apvrille and L. W. Li. [[Harmonizing safety, security and performance requirements in embedded systems.>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=8715124||shape="rect"]]. In (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51); text-align: left" %)//2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %), pp. 1631-1636. IEEE, 2019. 90 + 85 85 (% style="color: rgb(23,43,77);" %) 86 86 === Master Recommendations (not yet complete list, more to follow) === 87 87
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... ... @@ -1,1 +1,1 @@ 1 -https://rtsys.informatik.uni-kiel.de/confluence//wiki/spaces/SEM/pages/1426064 69/SS23 (Embedded Real-Time Systems)1 +https://rtsys.informatik.uni-kiel.de/confluence//wiki/spaces/SEM/pages/142606472/SS23 (Embedded Real-Time Systems)