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From version < 10.1 >
edited by Jette Petzold
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79 79  (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)D. L. Gurgel, C. M. Hirata and J. De M. Bezerra, [[A rule-based approach for safety analysis using STAMP/STPA>>url:https://ieeexplore.ieee.org/document/7311464||shape="rect"]]. //2015 IEEE/AIAA 34th Digital Avionics Systems Conference (DASC)//, 2015, pp. 7B2-1-7B2-8, doi: 10.1109/DASC.2015.7311464.
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82 +(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386||shape="rect"]]. In (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51); text-align: left" %)//2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %), pp. 26-33. IEEE, 2011.
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82 82  (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %)L. A. Cortes, P. Eles, and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1||shape="rect"]]. (% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51); text-align: left" %)//Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//(% style="color: rgb(34, 34, 34); color: rgb(51, 51, 51)" %). Vol. 1. IEEE, 2000.
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Id
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1 -142606469
1 +142606471
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1 -https://rtsys.informatik.uni-kiel.de/confluence//wiki/spaces/SEM/pages/142606469/SS23 (Embedded Real-Time Systems)
1 +https://rtsys.informatik.uni-kiel.de/confluence//wiki/spaces/SEM/pages/142606471/SS23 (Embedded Real-Time Systems)