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69	69	==== **Safety Analysis / Model Checking** ====
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72		-**[assigned]** (% style="color:#333333" %)S. Baumgart, J. Fröberg, and S. Punnekkat, [[Analyzing hazards in system-of-systems: Described in a quarry site automation context>>https://ieeexplore.ieee.org/document/7934783||shape="rect"]]. //2017 Annual IEEE International Systems Conference (SysCon)//, 2017, pp. 1-8, doi: (%%)10.1109/SYSCON.2017.7934783(% style="color:#333333" %).
	72	+(% style="color:#333333" %)S. Baumgart, J. Fröberg, and S. Punnekkat, [[Analyzing hazards in system-of-systems: Described in a quarry site automation context>>https://ieeexplore.ieee.org/document/7934783||shape="rect"]]. //2017 Annual IEEE International Systems Conference (SysCon)//, 2017, pp. 1-8, doi: (%%)10.1109/SYSCON.2017.7934783(% style="color:#333333" %).
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75	75	**[assigned]** (% style="color:#333333" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
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78	78	**[assigned]** J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386]]. In //2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//, pp. 26-33. IEEE, 2011.
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81		-**[assigned]** L. A. Cortes, P. Eles and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1]]. //Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//. Vol. 1. IEEE, 2000.
	81	+L. A. Cortes, P. Eles and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1]]. //Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//. Vol. 1. IEEE, 2000.
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84	84	=== Master Recommendations ===
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248	248	== Grades ==
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250		-This seminar is graded. The grade is based on each milestone (the different versions of the paper, the reviews, the slides, the talk, engagement in the workshop). For each milestone quality, timing (see dates) are graded. Missed deadline may cause you to fail the seminar.
	250	+This seminar is graded. The grade is based on each milestone (the different versions of the paper, the reviews, the slides, the talk). For each milestone quality, timing (see dates) are graded. Missed deadline may cause you to fail the seminar.
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252	252	= Technical Details =
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