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53	53	(% style="color:#333333" %)M. Lohstroh, C. Menard, A. Schulz-Rosengarten, M. Weber, J. Castrillon and E. A. Lee, [[A Language for Deterministic Coordination Across Multiple Timelines>>url:https://ieeexplore.ieee.org/document/9232939||shape="rect"]], //2020 Forum for Specification and Design Languages (FDL)//, 2020
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56		-(% style="color:#333333" %)L. Grimm, S. Smyth, A. Schulz-Rosengarten, R. von Hanxleden and M. Pouzet, [[From Lustre to Graphical Models and SCCharts>>url:https://ieeexplore.ieee.org/document/9232944||shape="rect"]], //2020 Forum for Specification and Design Languages (FDL)//, 2020, pp. 1-8, doi: 10.1109/FDL50818.2020.9232944.
	56	+**[assigned]** (% style="color:#333333" %)L. Grimm, S. Smyth, A. Schulz-Rosengarten, R. von Hanxleden and M. Pouzet, [[From Lustre to Graphical Models and SCCharts>>url:https://ieeexplore.ieee.org/document/9232944||shape="rect"]], //2020 Forum for Specification and Design Languages (FDL)//, 2020, pp. 1-8, doi: 10.1109/FDL50818.2020.9232944.
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59	59	M. C. Werner and K. Schneider, "[[From IEC 61131-3 Function Block Diagrams to Sequentially Constructive Statecharts>>https://ieeexplore.ieee.org/document/9925656]]," //2022 Forum on Specification & Design Languages (FDL)//, Linz, Austria, 2022, pp. 1-8, doi: 10.1109/FDL56239.2022.9925656.
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78	78	**[assigned]** J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386]]. In //2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//, pp. 26-33. IEEE, 2011.
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81		-L. A. Cortes, P. Eles and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1]]. //Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//. Vol. 1. IEEE, 2000.
	81	+**[assigned]** L. A. Cortes, P. Eles and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1]]. //Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//. Vol. 1. IEEE, 2000.
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84	84	=== Master Recommendations ===
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248	248	== Grades ==
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250		-This seminar is graded. The grade is based on each milestone (the different versions of the paper, the reviews, the slides, the talk). For each milestone quality, timing (see dates) are graded. Missed deadline may cause you to fail the seminar.
	250	+This seminar is graded. The grade is based on each milestone (the different versions of the paper, the reviews, the slides, the talk, engagement in the workshop). For each milestone quality, timing (see dates) are graded. Missed deadline may cause you to fail the seminar.
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252	252	= Technical Details =
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