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69	69	==== **Safety Analysis / Model Checking** ====
70	70
71	71	(% style="margin-left: 30.0px;" %)
72		-(% style="color:#333333" %)S. Baumgart, J. Fröberg, and S. Punnekkat, [[Analyzing hazards in system-of-systems: Described in a quarry site automation context>>https://ieeexplore.ieee.org/document/7934783||shape="rect"]]. //2017 Annual IEEE International Systems Conference (SysCon)//, 2017, pp. 1-8, doi: (%%)10.1109/SYSCON.2017.7934783(% style="color:#333333" %).
	72	+(% style="color:#333333" %)J. Axelsson and A. Kobetski, [[Towards a risk analysis method for systems-of-systems based on systems thinking>>url:https://ieeexplore.ieee.org/document/8369501||shape="rect"]]. //2018 Annual IEEE International Systems Conference (SysCon)//, 2018, pp. 1-8, doi: 10.1109/SYSCON.2018.8369501.
73	73
74	74	(% style="margin-left: 30.0px;" %)
75		-**[assigned]** (% style="color:#333333" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
	75	+(% style="color:#333333" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
76	76
77	77	(% style="margin-left: 30.0px;" %)
78		-**[assigned]** J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386]]. In //2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//, pp. 26-33. IEEE, 2011.
	78	+J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386]]. In //2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//, pp. 26-33. IEEE, 2011.
79	79
80	80	(% style="margin-left: 30.0px;" %)
81	81	L. A. Cortes, P. Eles and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1]]. //Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//. Vol. 1. IEEE, 2000.
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126	126	(% style="margin-left: 30.0px;" %)
127	127	(% style="color:#333333" %)A. Gannous, A. Andrews and B. Gallina, [[Toward a Systematic and Safety Evidence Productive Verification Approach for Safety-Critical Systems>>url:https://ieeexplore.ieee.org/document/8539215||shape="rect"]]. (%%)//2018 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)//(% style="color:#333333" %), 2018, pp. 329-336, doi: 10.1109/ISSREW.2018.00026.
128	128
129		-
130	130	= Schedule =
131	131
132	132	== Dates in the semester ==
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138	138	Milestone
139	139	)))
140	140	|(((
141		-Tue., 16.04 10:00
	140	+Tue. 16.04 10:00 CAP4 R.1115
142	142	)))|(((
143		-First Meeting/**Kick-Off **with a Latex and EasyChair introduction. The meeting will take place in room 11.1114/11.1115 in CAP4.
	142	+First Meeting/**Kick-Off **with a Latex and EasyChair introduction.
144	144	)))
145		-|(% colspan="1" %)Tue., 16.04 23:59|(% colspan="1" %)(% colspan="1" %)
	144	+|(% colspan="1" %)tbd|(% colspan="1" %)(% colspan="1" %)
146	146	(((
147	147	Deadline for topic selection (via email to Jette).
148	148	)))
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194	194	)))
195	195	|(% colspan="1" %)(% colspan="1" %)
196	196	(((
197		-Mo., 15.07, all day^^1^^
	196	+tbd, all day
198	198	)))|(% colspan="1" %)(% colspan="1" %)
199	199	(((
200	200	Final presentations
201	201	)))
202	202
203		-(% class="wikigeneratedid" %)
204		-//^^1^^preliminary date; please contact us if there are any conflicts with exams//
205		-
206	206	== The Final Presentations ==
207	207
208	208	The presentation of the prepared topic is held during a block seminar at **tbd**. The attendance at the seminar day is mandatory. Every attending person receives the proceedings of the current semester.