<
From version < 67.1 >
edited by Jette Petzold
on 2024/02/20 12:42
To version < 69.1 >
edited by Jette Petzold
on 2024/03/12 10:07
>
Change comment: There is no comment for this version

Summary

Details

Page properties
Content
... ... @@ -69,10 +69,10 @@
69 69  ==== **Safety Analysis / Model Checking** ====
70 70  
71 71  (% style="margin-left: 30.0px;" %)
72 -(% style="color:#333333" %)J. Axelsson and A. Kobetski, [[Towards a risk analysis method for systems-of-systems based on systems thinking>>url:https://ieeexplore.ieee.org/document/8369501||shape="rect"]]. //2018 Annual IEEE International Systems Conference (SysCon)//, 2018, pp. 1-8, doi: 10.1109/SYSCON.2018.8369501.
72 +(% style="color:#333333" %)S. Baumgart, J. Fröberg, and S. Punnekkat, [[Analyzing hazards in system-of-systems: Described in a quarry site automation context>>https://ieeexplore.ieee.org/document/7934783||shape="rect"]]. //2017 Annual IEEE International Systems Conference (SysCon)//, 2017, pp. 1-8, doi: (%%)10.1109/SYSCON.2017.7934783(% style="color:#333333" %).
73 73  
74 74  (% style="margin-left: 30.0px;" %)
75 -(% style="color:#333333" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
75 +**[assigned]** (% style="color:#333333" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
76 76  
77 77  (% style="margin-left: 30.0px;" %)
78 78  **[assigned]** J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386]]. In //2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//, pp. 26-33. IEEE, 2011.