Changes for page 2024 Synchronous Languages
Last modified by Maximilian Kasperowski on 2025/01/30 12:01
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edited by Alexander Schulz-Rosengarten
on 2024/02/20 12:06
on 2024/02/20 12:06
edited by Jette Petzold
on 2024/02/20 12:42
on 2024/02/20 12:42
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... ... @@ -75,7 +75,7 @@ 75 75 (% style="color:#333333" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867. 76 76 77 77 (% style="margin-left: 30.0px;" %) 78 -J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386]]. In //2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//, pp. 26-33. IEEE, 2011. 78 +**[assigned]** J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386]]. In //2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//, pp. 26-33. IEEE, 2011. 79 79 80 80 (% style="margin-left: 30.0px;" %) 81 81 L. A. Cortes, P. Eles and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1]]. //Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//. Vol. 1. IEEE, 2000.