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56	56	(% style="color:#333333" %)L. Grimm, S. Smyth, A. Schulz-Rosengarten, R. von Hanxleden and M. Pouzet, [[From Lustre to Graphical Models and SCCharts>>url:https://ieeexplore.ieee.org/document/9232944||shape="rect"]], //2020 Forum for Specification and Design Languages (FDL)//, 2020, pp. 1-8, doi: 10.1109/FDL50818.2020.9232944.
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	58	+(% style="margin-left: 30.0px;" %)
	59	+==== **Real-Time / Embedded** ====
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60		-==== **Safety Analysis / Model Checking** ====
	62	+Saranya Natarajan and David Broman, [[Temporal Property-Based Testing of a Timed C Compiler using Time-Flow Graph Semantics>>url:https://ieeexplore.ieee.org/document/9232935||shape="rect"]], //2020 Forum for Specification and Design Languages (FDL)//(% style="color:#333333" %), 2020
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62	62	(% style="margin-left: 30.0px;" %)
63		-(% style="color:#333333" %)J. Axelsson and A. Kobetski, [[Towards a risk analysis method for systems-of-systems based on systems thinking>>url:https://ieeexplore.ieee.org/document/8369501||shape="rect"]]. //2018 Annual IEEE International Systems Conference (SysCon)//, 2018, pp. 1-8, doi: 10.1109/SYSCON.2018.8369501.
	65	+Francisco Sant'Anna, Rodrigo Santos, and Noemi Rodriguez. 2021. [[Symmetric distributed applications>>url:https://dl.acm.org/doi/10.1145/3486605.3486786||shape="rect"]]. //Proceedings of the 8th ACM SIGPLAN International Workshop on Reactive and Event-Based Languages and Systems//. Association for Computing Machinery.
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65	65	(% style="margin-left: 30.0px;" %)
66		-(% style="color:#333333" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
	68	+==== **Safety Analysis** ====
67	67
68	68	(% style="margin-left: 30.0px;" %)
69		-J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386]]. In //2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//, pp. 26-33. IEEE, 2011.
	71	+(% style="color:#222222" %)Sven Stefan Krauss, Martin Rejzek, and Christian Hilbes. [[Tool Qualification Considerations for Tools Supporting STPA>>url:https://www.sciencedirect.com/science/article/pii/S1877705815038606||shape="rect"]]. (% style="text-align:left" %)//Procedia Engineering//(% style="color:#222222" %) 128 (2015): 15-24.
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71	71	(% style="margin-left: 30.0px;" %)
72		-L. A. Cortes, P. Eles and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1]]. //Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//. Vol. 1. IEEE, 2000.
	74	+(% style="color:#333333" %)H. Reza, M. Pimple, V. Krishna and J. Hildle, [[A Safety Analysis Method Using Fault Tree Analysis and Petri Nets>>url:https://ieeexplore.ieee.org/document/5070769||shape="rect"]]. (% style="color:#222222" %)//2009 Sixth International Conference on Information Technology: New Generations//(% style="color:#333333" %), 2009, pp. 1089-1094, doi: 10.1109/ITNG.2009.183.
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	76	+(% style="margin-left: 30.0px;" %)
	77	+(% style="color:#333333" %)J. Axelsson and A. Kobetski, [[Towards a risk analysis method for systems-of-systems based on systems thinking>>url:https://ieeexplore.ieee.org/document/8369501||shape="rect"]]. //2018 Annual IEEE International Systems Conference (SysCon)//, 2018, pp. 1-8, doi: 10.1109/SYSCON.2018.8369501.
74	74
	79	+(% style="margin-left: 30.0px;" %)
	80	+(% style="color:#333333" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
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	82	+(% style="margin-left: 30.0px;" %)
	83	+(% style="color:#333333" %)D. L. Gurgel, C. M. Hirata and J. De M. Bezerra, [[A rule-based approach for safety analysis using STAMP/STPA>>url:https://ieeexplore.ieee.org/document/7311464||shape="rect"]]. //2015 IEEE/AIAA 34th Digital Avionics Systems Conference (DASC)//, 2015, pp. 7B2-1-7B2-8, doi: 10.1109/DASC.2015.7311464.
	84	+
75	75	=== Master Recommendations ===
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