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55	55	(% style="margin-left: 30.0px;" %)
56	56	(% style="color:#333333" %)L. Grimm, S. Smyth, A. Schulz-Rosengarten, R. von Hanxleden and M. Pouzet, [[From Lustre to Graphical Models and SCCharts>>url:https://ieeexplore.ieee.org/document/9232944||shape="rect"]], //2020 Forum for Specification and Design Languages (FDL)//, 2020, pp. 1-8, doi: 10.1109/FDL50818.2020.9232944.
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58		-(% style="margin-left: 30.0px;" %)
59		-==== **Real-Time / Embedded** ====
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61	61	(% style="margin-left: 30.0px;" %)
62		-Saranya Natarajan and David Broman, [[Temporal Property-Based Testing of a Timed C Compiler using Time-Flow Graph Semantics>>url:https://ieeexplore.ieee.org/document/9232935||shape="rect"]], //2020 Forum for Specification and Design Languages (FDL)//(% style="color:#333333" %), 2020
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65		-Francisco Sant'Anna, Rodrigo Santos, and Noemi Rodriguez. 2021. [[Symmetric distributed applications>>url:https://dl.acm.org/doi/10.1145/3486605.3486786||shape="rect"]]. //Proceedings of the 8th ACM SIGPLAN International Workshop on Reactive and Event-Based Languages and Systems//. Association for Computing Machinery.
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67		-(% style="margin-left: 30.0px;" %)
68	68	==== **Safety Analysis** ====
69	69
70	70	(% style="margin-left: 30.0px;" %)
71		-(% style="color:#222222" %)Sven Stefan Krauss, Martin Rejzek, and Christian Hilbes. [[Tool Qualification Considerations for Tools Supporting STPA>>url:https://www.sciencedirect.com/science/article/pii/S1877705815038606||shape="rect"]]. (% style="text-align:left" %)//Procedia Engineering//(% style="color:#222222" %) 128 (2015): 15-24.
	63	+(% style="color:#333333" %)J. Axelsson and A. Kobetski, [[Towards a risk analysis method for systems-of-systems based on systems thinking>>url:https://ieeexplore.ieee.org/document/8369501||shape="rect"]]. //2018 Annual IEEE International Systems Conference (SysCon)//, 2018, pp. 1-8, doi: 10.1109/SYSCON.2018.8369501.
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73	73	(% style="margin-left: 30.0px;" %)
74		-(% style="color:#333333" %)H. Reza, M. Pimple, V. Krishna and J. Hildle, [[A Safety Analysis Method Using Fault Tree Analysis and Petri Nets>>url:https://ieeexplore.ieee.org/document/5070769||shape="rect"]]. (% style="color:#222222" %)//2009 Sixth International Conference on Information Technology: New Generations//(% style="color:#333333" %), 2009, pp. 1089-1094, doi: 10.1109/ITNG.2009.183.
	66	+(% style="color:#333333" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
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76	76	(% style="margin-left: 30.0px;" %)
77		-(% style="color:#333333" %)J. Axelsson and A. Kobetski, [[Towards a risk analysis method for systems-of-systems based on systems thinking>>url:https://ieeexplore.ieee.org/document/8369501||shape="rect"]]. //2018 Annual IEEE International Systems Conference (SysCon)//, 2018, pp. 1-8, doi: 10.1109/SYSCON.2018.8369501.
	69	+J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386]]. In //2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//, pp. 26-33. IEEE, 2011.
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79	79	(% style="margin-left: 30.0px;" %)
80		-(% style="color:#333333" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867.
	72	+L. A. Cortes, P. Eles and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1]]. //Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//. Vol. 1. IEEE, 2000.
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82		-(% style="margin-left: 30.0px;" %)
83		-(% style="color:#333333" %)D. L. Gurgel, C. M. Hirata and J. De M. Bezerra, [[A rule-based approach for safety analysis using STAMP/STPA>>url:https://ieeexplore.ieee.org/document/7311464||shape="rect"]]. //2015 IEEE/AIAA 34th Digital Avionics Systems Conference (DASC)//, 2015, pp. 7B2-1-7B2-8, doi: 10.1109/DASC.2015.7311464.
84	84
85	85	=== Master Recommendations ===
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