Changes for page 2024 Synchronous Languages
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... ... @@ -58,13 +58,8 @@ 58 58 (% style="margin-left: 30.0px;" %) 59 59 ==== **Real-Time / Embedded** ==== 60 60 61 -(% style="margin-left: 30.0px;" %) 62 -Saranya Natarajan and David Broman, [[Temporal Property-Based Testing of a Timed C Compiler using Time-Flow Graph Semantics>>url:https://ieeexplore.ieee.org/document/9232935||shape="rect"]], //2020 Forum for Specification and Design Languages (FDL)//(% style="color:#333333" %), 2020 63 63 64 64 (% style="margin-left: 30.0px;" %) 65 -Francisco Sant'Anna, Rodrigo Santos, and Noemi Rodriguez. 2021. [[Symmetric distributed applications>>url:https://dl.acm.org/doi/10.1145/3486605.3486786||shape="rect"]]. //Proceedings of the 8th ACM SIGPLAN International Workshop on Reactive and Event-Based Languages and Systems//. Association for Computing Machinery. 66 - 67 -(% style="margin-left: 30.0px;" %) 68 68 ==== **Safety Analysis** ==== 69 69 70 70 (% style="margin-left: 30.0px;" %) ... ... @@ -71,9 +71,6 @@ 71 71 (% style="color:#222222" %)Sven Stefan Krauss, Martin Rejzek, and Christian Hilbes. [[Tool Qualification Considerations for Tools Supporting STPA>>url:https://www.sciencedirect.com/science/article/pii/S1877705815038606||shape="rect"]]. (% style="text-align:left" %)//Procedia Engineering//(% style="color:#222222" %) 128 (2015): 15-24. 72 72 73 73 (% style="margin-left: 30.0px;" %) 74 -(% style="color:#333333" %)H. Reza, M. Pimple, V. Krishna and J. Hildle, [[A Safety Analysis Method Using Fault Tree Analysis and Petri Nets>>url:https://ieeexplore.ieee.org/document/5070769||shape="rect"]]. (% style="color:#222222" %)//2009 Sixth International Conference on Information Technology: New Generations//(% style="color:#333333" %), 2009, pp. 1089-1094, doi: 10.1109/ITNG.2009.183. 75 - 76 -(% style="margin-left: 30.0px;" %) 77 77 (% style="color:#333333" %)J. Axelsson and A. Kobetski, [[Towards a risk analysis method for systems-of-systems based on systems thinking>>url:https://ieeexplore.ieee.org/document/8369501||shape="rect"]]. //2018 Annual IEEE International Systems Conference (SysCon)//, 2018, pp. 1-8, doi: 10.1109/SYSCON.2018.8369501. 78 78 79 79 (% style="margin-left: 30.0px;" %) ... ... @@ -80,8 +80,12 @@ 80 80 (% style="color:#333333" %)F. G. R. de Souza, J. de Melo Bezerra, C. M. Hirata, P. de Saqui-Sannes and L. Apvrille, [[Combining STPA with SysML Modeling>>url:https://ieeexplore.ieee.org/document/9275867||shape="rect"]]. //2020 IEEE International Systems Conference (SysCon)//, 2020, pp. 1-8, doi: 10.1109/SysCon47679.2020.9275867. 81 81 82 82 (% style="margin-left: 30.0px;" %) 83 - (%style="color:#333333" %)D. L. Gurgel,C.M.HirataandJ.De M.Bezerra,[[A rule-basedapproachforsafetynalysisusingSTAMP/STPA>>url:https://ieeexplore.ieee.org/document/7311464||shape="rect"]].5IEEE/AIAA34thDigital AvionicsSystemsConference(DASC)//,2015,pp.7B2-1-7B2-8,doi: 10.1109/DASC.2015.7311464.75 +J. Kloos, T. Hussain, and R. Eschbach. [[Risk-based testing of safety-critical embedded systems driven by fault tree analysis>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5954386]]. In //2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops//, pp. 26-33. IEEE, 2011. 84 84 77 +(% style="margin-left: 30.0px;" %) 78 +L. A. Cortes, P. Eles and Z. Peng, [[Formal coverification of embedded systems using model checking>>url:https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=874622&tag=1]]. //Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future//. Vol. 1. IEEE, 2000. 79 + 80 + 85 85 === Master Recommendations === 86 86 87 87 (% style="margin-left: 30.0px;" %)